AFM and optical sensing guides
Practical introductions for researchers and engineers: choose AFM probe geometry, investigate changing measurements and understand the research behind optical sensing.
AFM probe durability and tip wear
Recognise possible tip changes, distinguish wear from contamination and breakage, and compare useful probe lifetime using a defined measurement check.
AFM tip radius, geometry and resolution
Understand why tip radius is only part of image resolution, how a tip reaches surface features, and how sampling and feedback affect the result.
What enables faster AFM scanning?
Understand how cantilever response, tip mass, feedback and instrument limits affect scanning speed and image quality.
AFM for semiconductor surface metrology
Explore AFM applications in semiconductor metrology, and why tip durability and faster scanning matter across repeated surface measurements.
Raman polaritonics: infrared sensitivity with visible-light readout
Learn how SiC resonators respond to nearby materials, how Raman light reads the signal and what thin-film research has shown.